25–26 Jun 2026
''Vasil Levski'' National Military University
Europe/Sofia timezone

Development of a Method for Calibration of a Semiconductor Temperature Measurement Sensors

Not scheduled
20m
''Vasil Levski'' National Military University

''Vasil Levski'' National Military University

Veliko Tarnovo, Bulgaria
Paper – Oral Presentation Laser Technology

Speaker

Tsanko Karadzhov (Technical University of Gabrovo)

Description

Temperature is one of the most commonly measured quantities in science and industry. Temperature can have a significant impact on the course of various processes therefore, its accurate measurement and control is a task of particular importance for every process in everyday life, science, and industry. Precise temperature measurement is used in all fields - electronics, communications, mechanical engineering and medicine, and determines the quality of the manufactured product. In this study, an experimental calibration was performed on a semiconductor thermistor with a nominal resistance of 10 kΩ in the temperature range from 0°C to 90°C. Based on the experimental data obtained, the coefficients of the Steinhart–Hart equation were determined, which allow for a more precision determination of the temperature from the measured resistance of the sensor.

Authors

Dimitar Dichev (Technical University of Gabrovo) Iliya Zhelezarov (Technical University of Gabrovo) Iliyan Gspodinov (Technical University of Gabrovo) Tsanko Karadzhov (Technical University of Gabrovo)

Presentation materials

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